Sun Microsystems Standardizes on LogicVision's Embedded Test Solutions

SAN JOSE, Calif.--(BUSINESS WIRE)--Dec. 11, 2001--LogicVision, Inc. (Nasdaq:LGVN - news), a leading provider of embedded test IP solutions, today announced that Sun Microsystems, Inc. (Nasdaq:SUNW - news) has signed a multi-year agreement that deploys LogicVision's Embedded Test Solutions. Sun plans to use LogicVision's embedded test throughout Sun's IC design activities, enabling Sun to leverage the test methodologies solution from IC design to end system product.

"Our previous experience with LogicVision's Embedded Test Solutions demonstrated the usefulness of test capabilities that span our hardware development and manufacturing environment," said Sunil Joshi, vice president of Design Automation & Computer Resources for Sun Microsystems. "LogicVision offers an integrated methodology which has potential for reducing test costs, improved resource utilization, and allowing higher degrees of test re-use."

To achieve the re-use of test that spans Sun's product lifetime, Sun is using a broad set of embedded test capabilities from LogicVision's family of embedded test functions:

• Embedded hierarchical logic test and memory test;
• External memory test for board and systems; and
• Core test and chip test assembly.

"This engagement represents Sun's acceptance of LogicVision's embedded test products as important solutions that overcome many of the test and diagnostic challenges facing the electronics industry," said Vinod Agarwal, president and CEO of LogicVision. "We strongly believe that as system complexity increases, the benefits of embedded test will also become increasingly more apparent to other companies tasked with delivering reliable systems to the marketplace."

About LogicVision Inc.

LogicVision (Nasdaq:LGVN - news) provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.

FORWARD LOOKING STATEMENTS:

Except for the historical information contained herein, the matters set forth in this press release, including statements as to the expectation that the benefits of embedded test will become more apparent to other systems companies, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the impact of competitive products and pricing and of alternative technological advances, and other risks detailed in LogicVision's Prospectus dated October 31, 2001 filed with the SEC and from time to time in LogicVision's SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.

Note to Editors: Sun, Sun Microsystems, the Sun logo, Solaris, Java, Sun Cobalt, and The Network Is The Computer are trademarks or registered trademarks of Sun Microsystems, Inc. in the United States and other countries The LogicVision name and logo are trademarks of LogicVision Corporation. All other trademarks and servicemarks are the property of their respective owners.

LogicVision, Embedded Test, LogicVision Ready and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other trademarks and service marks are the property of their respective owners.

-0-

ACRONYMS AND DEFINITIONS:

ATE:   Automatic Test Equipment   IC:       Integrated Circuit
ATPG:  Automatic Test Pattern     RTL:      Register Transfer-Level --
       Generation                           A chip design language
BIST:  Built-i-Self-Test                    format -- technology
DFT:   Design-for-Test                      independent that can be
EDA:   Electronic Design                    Verilog or VHDL.
       Automation                 Verilog:  A hardware description
GDSII: An industry format                   language used to
       describing the physical              design and document
       structure of the chip                electronic systems.
       design and used to         VHDL:     VHSIC (Very High-Speed
       create mask tooling                  Integrated Circuit) HDL
       for chip maufacturing.     IP:       Intellectual Property
GUI:   Graphics User Interface    SoC:      System-on-chip
HDL:   Hardware Description
       Language --  Describes
       the architecture and
       behavior of discrete
       electronic systems.

     LogicVision
     Clarisse Balistreri, 408/453-0146
     clarisse@logicvision.com
        or
     The Loomis Group for LogicVision
     Vincent Mayeda, 909/614-1767
     vincent@loomisgroup.com